Tip-to-sample distance dependence of an electrostatic force in KFM measurements
| Autor: | Takahashi, Takuji *, Ono, Shiano |
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| Zdroj: | In Ultramicroscopy 2004 100(3):287-292 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Takahashi, Takuji *, Ono, Shiano |
|---|---|
| Zdroj: | In Ultramicroscopy 2004 100(3):287-292 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect