Study of the dielectric properties near the band gap by VEELS: gap measurement in bulk materials

Autor:	Schamm, S. *, Zanchi, G.
Zdroj:	In Ultramicroscopy 2003 96(3):559-564
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect