Y-doped HfO2 deposited by atomic layer deposition using a cocktail precursor for DRAM capacitor dielectric application

Autor: Kim, Jenam, Kim, Byung Seok, Lee, Ae Jin, Han, Dong Hee, Hwang, Ji Hyeon, Kim, Youngjin, Song, Ki-Chang, Oh, Hansol, Kim, Sangho, Park, Yongjoo, Jeon, Woojin
Zdroj: In Ceramics International 1 February 2022 48(3):3236-3242
Databáze: ScienceDirect