Rapid thermal annealing effect of transparent ITO source and drain electrode for transparent thin film transistors

Autor: Park, Jin-Hyeok, Seok, Hae-Jun, Jung, Sung Hyeon, Cho, Hyung Koun, Kim, Han-Ki
Zdroj: In Ceramics International 1 February 2021 47(3):3149-3158
Databáze: ScienceDirect