Mechanism of novel defect multiplication impacting high power 4H-SiC devices

Autor: Mahadik, N.A., Dudley, M., Raghothamachar, B., Chen, Z., Stahlbush, R.E., Hinojosa, M., Lelis, A., Sung, W.
Zdroj: In Materials & Design December 2024 248
Databáze: ScienceDirect