Mechanism of novel defect multiplication impacting high power 4H-SiC devices
Autor: | Mahadik, N.A., Dudley, M., Raghothamachar, B., Chen, Z., Stahlbush, R.E., Hinojosa, M., Lelis, A., Sung, W. |
---|---|
Zdroj: | In Materials & Design December 2024 248 |
Databáze: | ScienceDirect |
Externí odkaz: |