Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis
| Autor: | Korsunsky, A.M., Salvati, E., Lunt, A.G.J., Sui, T., Mughal, M.Z., Daniel, R., Keckes, J., Bemporad, E., Sebastiani, M. |
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| Zdroj: | In Materials & Design 5 May 2018 145:55-64 |
| Databáze: | ScienceDirect |
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