Warpage analysis of multilayer thin film/substrate systems using the Eigenstrain method
| Autor: | Zhang, Zaoxu, Zhao, Xueying, Zhao, Kechen, Ji, Qingxiang, Wang, Changguo |
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| Zdroj: | In Thin-Walled Structures December 2024 205 Part B |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect