Semi-in-situ thermal transport characterization of thermal interface materials through a low-frequency thermoreflectance technique
Autor: | Li, Xuancheng, Li, Anran, Shi, Hang, Yao, Yimin, Ye, Zhenqiang, Wen, Zhibin, Ren, LinLin, Zeng, Xiaoliang, Xu, Jianbin, Han, Meng, Sun, Rong |
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Zdroj: | In Measurement 30 January 2025 240 |
Databáze: | ScienceDirect |
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