Semi-in-situ thermal transport characterization of thermal interface materials through a low-frequency thermoreflectance technique

Autor: Li, Xuancheng, Li, Anran, Shi, Hang, Yao, Yimin, Ye, Zhenqiang, Wen, Zhibin, Ren, LinLin, Zeng, Xiaoliang, Xu, Jianbin, Han, Meng, Sun, Rong
Zdroj: In Measurement 30 January 2025 240
Databáze: ScienceDirect