High-resolution microscopic fringe projection profilometry using Nyquist frequency fringe

Autor: Wang, Dezhao, Zhou, Weihu, Zhang, Zili, Kang, Yanhui, Sheng, Xiaoyan, Meng, Fanchang, Wang, Na
Zdroj: In Measurement 15 January 2025 239
Databáze: ScienceDirect