High-resolution microscopic fringe projection profilometry using Nyquist frequency fringe
Autor: | Wang, Dezhao, Zhou, Weihu, Zhang, Zili, Kang, Yanhui, Sheng, Xiaoyan, Meng, Fanchang, Wang, Na |
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Zdroj: | In Measurement 15 January 2025 239 |
Databáze: | ScienceDirect |
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