Image-driven machine learning for automatic characterization of grain size and distribution in smart vanadium dioxide thin films

Autor: Zerrouki, Nabil, Zouina Ait-Djafer, Amina, Harrou, Fouzi, Lafane, Slimane, Abdelli-Messaci, Samira, Sun, Ying
Zdroj: In Measurement 30 June 2024 233
Databáze: ScienceDirect