Scoring Bayesian Neural Networks for learning from inconsistent labels in surface defect segmentation
| Autor: | Niu, Tongzhi, Chen, Biao, Lyu, Qianhang, Li, Bei, Luo, Wei, Wang, Zhenrong, Li, Bin |
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| Zdroj: | In Measurement 15 February 2024 225 |
| Databáze: | ScienceDirect |
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