PCB defect detection with self-supervised learning of local image patches
| Autor: | Yao, Naifu, Zhao, Yongqiang, Kong, Seong G., Guo, Yang |
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| Zdroj: | In Measurement 30 November 2023 222 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Yao, Naifu, Zhao, Yongqiang, Kong, Seong G., Guo, Yang |
|---|---|
| Zdroj: | In Measurement 30 November 2023 222 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect