Direct measurement of electron drift parameters in pixelated cadmium zinc telluride semiconductor detectors
| Autor: | Yang, Jian, Li, Yu-Lan, Zeng, Guo-Qiang, Tian, Cheng-Shuai, Deng, Hao-Wen, Li, Xin-Yue |
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| Zdroj: | In Measurement October 2023 220 |
| Databáze: | ScienceDirect |
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