Perspective estimation of light emitting diode reliability measures based on multiply accelerated long run stress testing backed up by stochastic diffusion process
| Autor: | Vališ, David, Forbelská, Marie, Vintr, Zdeněk, Tiep La, Quoc, Leuchter, Jan |
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| Zdroj: | In Measurement January 2023 206 |
| Databáze: | ScienceDirect |
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