A deep learning based malicious module identification using stacked sparse autoencoder network for VLSI circuit reliability
| Autor: | Priyatharishini, M., Nirmala Devi, M. |
|---|---|
| Zdroj: | In Measurement 15 May 2022 194 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Priyatharishini, M., Nirmala Devi, M. |
|---|---|
| Zdroj: | In Measurement 15 May 2022 194 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect