Design of a sample approach mechanism for a metrological atomic force microscope
| Autor: | Piot, J., Qian, J., Pirée, H., Kotte, G., Pétry, J., Kruth, J.-P., Vanherck, P., Van Haesendonck, C., Reynaerts, D. |
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| Zdroj: | In Measurement January 2013 46(1):739-746 |
| Databáze: | ScienceDirect |
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