Determination of dielectric constant and loss of high- K thin films in the microwave frequencies
| Autor: | Sudheendran, K., Pamu, D., Ghanashyam Krishna, M., James Raju, K.C. |
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| Zdroj: | In Measurement 2010 43(4):556-562 |
| Databáze: | ScienceDirect |
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