Regulating the uniformity of DLC films in ECR plasma with negative substrate biasing

Autor: Deng, Q.Y., Wang, C.M., Zhang, T.F., Yang, Wenmao, Li, Xueyuan, Huang, N., Leng, Y.X.
Zdroj: In Surface & Coatings Technology 15 May 2019 365:15-23
Databáze: ScienceDirect