Continuous cyclic deformations of a Ni/W film studied by synchrotron X-ray diffraction

Autor: Renault, P.O., Sadat, T., Godard, P., He, W., Guerin, Ph., Geandier, G., Blanc, N., Boudet, N., Goudeau, P.
Zdroj: In Surface & Coatings Technology 25 December 2017 332:351-357
Databáze: ScienceDirect