Characterization of Sn and Si nanocrystals embedded in SiO2 matrix fabricated by magnetron co-sputtering

Autor: Huang, Shihua, Chen, Yongyue, Xiao, Hong, Lu, Fang
Zdroj: In Surface & Coatings Technology 25 December 2010 205(7):2247-2250
Databáze: ScienceDirect