Aperiodic W/B 4C multilayer systems for X-ray optics: Quantitative determination of layer thickness by HAADF-STEM and X-ray reflectivity
| Autor: | Häussler, D., Morawe, Ch., Roß, U., Ögüt, B., Spiecker, E., Jäger, W., Hertlein, F., Heidorn, U., Wiesmann, J. |
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| Zdroj: | In Surface & Coatings Technology 2010 204(12):1929-1932 |
| Databáze: | ScienceDirect |
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