Interface structure of microcrystalline silicon deposited by inductive coupled plasma using internal low inductance antenna

Autor: Kaki, H., Tomyo, A., Takahashi, E., Hayashi, T., Ogata, K., Ebe, A., Takenaka, K., Setsuhara, Y.
Zdroj: In Surface & Coatings Technology 30 August 2008 202(22-23):5672-5675
Databáze: ScienceDirect