Characterization of ‘ARE’ deposited silicon nitride films and their feasibility as antireflection coating

Autor: Patil, Sheetal J., Mohite, K.C., Mandale, A.B., Takwale, M.G., Gangal, S.A.
Zdroj: In Surface & Coatings Technology 2005 200(7):2058-2064
Databáze: ScienceDirect