Optical emission study of CH 4+CHF 3 ECR plasma and properties of a-C:F:H films

Autor: Xin, Y *, Ning, Z.Y, Ye, C, Lu, X.H, Xiang, S.L, Du, W, Huang, S, Chen, J, Cheng, S.H
Zdroj: In Surface & Coatings Technology 2003 173(2):172-177
Databáze: ScienceDirect