Study of microstructure and magnetization reversal mechanism in granular CoCrPt:SiO2 films of variable thickness

Autor: Varvaro, G., Testa, A.M., Agostinelli, E., Fiorani, D., Laureti, S., Springer, F., Brombacher, C., Albrecht, M., Del Bianco, L., Barucca, G., Mengucci, P., Rinaldi, D.
Zdroj: In Materials Chemistry and Physics 16 September 2013 141(2-3):790-796
Databáze: ScienceDirect