Thermal analysis on the degradation of poly-silicon TFTs under AC stress
| Autor: | Weng, C.F., Chang, T.C., Tai, Y.H., Huang, S.T., Wu, K.T., Chen, C.W., Kuo, W.C., Young, T.F. |
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| Zdroj: | In Materials Chemistry and Physics 2009 116(2):344-347 |
| Databáze: | ScienceDirect |
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