Optical properties of Pb(Zr xTi 1− x)O 3 ( x = 0.4, 0.6) thin films on Pt-coated Si substrates studied by spectroscopic ellipsometry
| Autor: | Tang, X.G. a, b, ⁎, Liu, Q.X. b, Jiang, L.L. c, Ding, A.L. d |
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| Zdroj: | In Materials Chemistry and Physics 2007 103(2):329-333 |
| Databáze: | ScienceDirect |
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