Scanning probe microscopy — a tool for the investigation of high- k materials
| Autor: | Landau, S.A *, Junghans, N, Weiß, P.-A, Kolbesen, B.O, Olbrich, A, Schindler, G, Hartner, W, Hintermaier, F, Dehm, C, Mazuré, C |
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| Zdroj: | In Applied Surface Science 2000 157(4):387-392 |
| Databáze: | ScienceDirect |
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