Raman spectroscopic and atomic force microscopic study of graphite ablation at 193 and 248 nm
| Autor: | Mechler, Á *, Heszler, P, Márton, Zs, Kovács, M, Szörényi, T, Bor, Z |
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| Zdroj: | In Applied Surface Science 2000 154:22-28 |
| Databáze: | ScienceDirect |
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