Off resonance ac mode force spectroscopy and imaging with an atomic force microscope
| Autor: | Jarvis, S.P. a, *, Lantz, M.A. a, Dürig, U. b, Tokumoto, H. a |
|---|---|
| Zdroj: | In Applied Surface Science 1999 140(3):309-313 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
| Autor: | Jarvis, S.P. a, *, Lantz, M.A. a, Dürig, U. b, Tokumoto, H. a |
|---|---|
| Zdroj: | In Applied Surface Science 1999 140(3):309-313 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect