Characterization of AlGaAs/GeSn heterojunction band alignment via X-ray photoelectron spectroscopy
Autor: | Liu, Yang a, 1, Gong, Jiarui a, 1, Acharya, Sudip b, 1, Li, Yiran a, Abrand, Alireza c, Fei, Fan d, Rudie, Justin M. b, Zhou, Jie a, Lu, Yi a, Naeem Abbasi, Haris a, Vincent, Daniel a, Haessly, Samuel a, Tsai, Tsung-Han a, Xiao, Jun d, Mohseni, Parsian K. c, ⁎, Yu, Shui-Qing b, ⁎, Ma, Zhenqiang a, ⁎ |
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Zdroj: | In Applied Surface Science 15 March 2025 685 |
Databáze: | ScienceDirect |
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