Evolution of the liquid/solid interface roughness in Si1-xGex layers processed by nanosecond laser annealing
| Autor: | Demoulin, R., Daubriac, R., Kerdilès, S., Dagault, L., Adami, O., Ricciarelli, D., Hartmann, J.-M., Chiodi, F., Mio, A.M., Opprecht, M., Scheid, E., Alba, P.Acosta, Débarre, D., Magna, A.La, Cristiano, F. |
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| Zdroj: | In Applied Surface Science 1 March 2025 684 |
| Databáze: | ScienceDirect |
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