Enhancing reliability in oxide-based memristors using two-dimensional transition metal dichalcogenides

Autor: Lee, Donghyeon, Kim, Seung-Mo, Park, Jun-Cheol, Jung, Yoonsung, Lee, Soyeon, Lee, Byoung Hun, Lee, Sanghan
Zdroj: In Applied Surface Science 15 January 2025 679
Databáze: ScienceDirect