Enhancing reliability in oxide-based memristors using two-dimensional transition metal dichalcogenides
Autor: | Lee, Donghyeon, Kim, Seung-Mo, Park, Jun-Cheol, Jung, Yoonsung, Lee, Soyeon, Lee, Byoung Hun, Lee, Sanghan |
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Zdroj: | In Applied Surface Science 15 January 2025 679 |
Databáze: | ScienceDirect |
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