Vacancy-driven resistive switching behavior based on wafer-scale MoSe2 artificial synapses

Autor: Zhong, Jixiang, Lin, Xin, Sun, Han, Wang, Fang, Liu, Kai, Wei, Junqing, Li, Zewen, Ji, Yujing, Liu, Peng, Liu, Weili, Zhang, Kailiang
Zdroj: In Applied Surface Science 30 December 2024 678
Databáze: ScienceDirect