Environmental stability and ageing of ScN thin films from XPS Ar+ depth profiling
| Autor: | Cichoň, Stanislav, More-Chevalier, Joris, Wdowik, Urszula D., de Prado, Esther, Bulíř, Jiří, Novotný, Michal, Fekete, Ladislav, Duchoň, Jan, Legut, Dominik, Lančok, Ján |
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| Zdroj: | In Applied Surface Science 15 November 2024 674 |
| Databáze: | ScienceDirect |
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