Surface analysis, oxidation resistance, and embossing of Ge-based solution-processed thin films as materials for high refractive index optical elements
Autor: | Slang, Stanislav, Kurka, Michal, Jancalek, Jiri, Rodriguez-Pereira, Jhonatan, Chylii, Maksym, Houdek, Jakub, Jemelka, Jiri, Svoboda, Roman, Bartak, Jaroslav, Vlcek, Miroslav, Palka, Karel |
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Zdroj: | In Applied Surface Science 1 November 2024 672 |
Databáze: | ScienceDirect |
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