Surface analysis, oxidation resistance, and embossing of Ge-based solution-processed thin films as materials for high refractive index optical elements

Autor: Slang, Stanislav, Kurka, Michal, Jancalek, Jiri, Rodriguez-Pereira, Jhonatan, Chylii, Maksym, Houdek, Jakub, Jemelka, Jiri, Svoboda, Roman, Bartak, Jaroslav, Vlcek, Miroslav, Palka, Karel
Zdroj: In Applied Surface Science 1 November 2024 672
Databáze: ScienceDirect