Plasma atomic layer etching of ruthenium by oxygen adsorption-removal cyclic process

Autor: Kim, Doo San, Kwon, Hae In, Jang, Yun Jong, Kim, Gyoung Chan, Gil, Hong Seong, Kim, Dae Whan, Jeong, Byeong Hwa, Yeom, Geun Young
Zdroj: In Applied Surface Science 15 October 2024 670
Databáze: ScienceDirect