Optical constants and thickness determination of La[formula omitted]Sr[formula omitted]MnO3 thin films on Nb:SrTiO3 substrates by spectro-ellipsometry: Combination of optical and X-ray techniques
| Autor: | Blond, Jérémy, Dufour, Christian, Chaluvadi, Sandeep Kumar, Duprey, Sylvain, Portier, Xavier, Marie, Philippe, Pierron, Victor, Méchin, Laurence, Guillet, Bruno |
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| Zdroj: | In Applied Surface Science 1 October 2024 669 |
| Databáze: | ScienceDirect |
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