Depth profiling of microwave nitrogen-terminated polycrystalline diamond surfaces by energy-dependent X-ray photoelectron spectroscopy

Autor: Chemin, Arsène, Kuntumalla, Mohan Kumar, Brzhezinskaya, Maria, Petit, Tristan, Hoffman, Alon
Zdroj: In Applied Surface Science 15 July 2024 661
Databáze: ScienceDirect