NF3 and F2 gas fluorination of GaN surface and Pt/GaN interface analyzed by hard X-ray photoelectron spectroscopy

Autor: Matsuda, Asahiko, Teramoto, Takashi, Nagata, Takahiro, Gerlach, Dominic, Shen, Peng, Ueda, Shigenori, Kimura, Takako, Dussarrat, Christian, Chikyow, Toyohiro
Zdroj: In Applied Surface Science 30 June 2024 659
Databáze: ScienceDirect