Femtosecond laser ablation (fs-LA) XPS – A novel XPS depth profiling technique for thin films, coatings and multi-layered structures
| Autor: | Baker, M.A., Bacon, S.R., Sweeney, S.J., Hinder, S.J., Bushell, A., Nunney, T.S., White, R.G. |
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| Zdroj: | In Applied Surface Science 1 May 2024 654 |
| Databáze: | ScienceDirect |
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