Local electrical characteristic of memristor structure in a high-resistance state obtained using electrostatic force microscopy: Fractal and multifractal dynamics of surface

Autor: Ramazanov, Shikhgasan, Orudzhev, Farid, Gajiev, Gaji, Holcman, Vladimír, Matos, Robert Saraiva, da Fonseca Filho, Henrique Duarte, Ţălu, Ştefan, Selimov, Daud
Zdroj: In Applied Surface Science 28 February 2024 647
Databáze: ScienceDirect