Local electrical characteristic of memristor structure in a high-resistance state obtained using electrostatic force microscopy: Fractal and multifractal dynamics of surface
Autor: | Ramazanov, Shikhgasan, Orudzhev, Farid, Gajiev, Gaji, Holcman, Vladimír, Matos, Robert Saraiva, da Fonseca Filho, Henrique Duarte, Ţălu, Ştefan, Selimov, Daud |
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Zdroj: | In Applied Surface Science 28 February 2024 647 |
Databáze: | ScienceDirect |
Externí odkaz: |