Interfacial reactions and nucleation of WAl12 phase on electromigration in hydrogen exposed semiconductor interconnects

Autor: Seok Kim, Jin, Hyun Choe, Jin, Won Ahn, Da, Soo Jung, Eun, Gyu Pyo, Sung
Zdroj: In Applied Surface Science 15 March 2023 613
Databáze: ScienceDirect