Study of Schottky barrier detectors based on a high quality 4H-SiC epitaxial layer with different thickness

Autor: Zaťko, Bohumír, Hrubčín, Ladislav, Šagátová, Andrea, Osvald, Jozef, Boháček, Pavol, Kováčová, Eva, Halahovets, Yuriy, Rozov, Sergey V., Sandukovskij, V.G.
Zdroj: In Applied Surface Science 15 January 2021 536
Databáze: ScienceDirect