Origin and evolution of threading dislocation in CdZnTe(0 0 1)/GaAs(0 0 1) epilayer grown by close spaced sublimation

Autor: Cao, Kun, Jie, Wanqi, Zha, Gangqiang, Dong, Jiangpeng, Li, Yang, Wu, Sihong, Wang, Yawei, Zhang, Hao, Lin, Yun
Zdroj: In Applied Surface Science 28 February 2020 504
Databáze: ScienceDirect