Non-destructive depth profile reconstruction of single-layer graphene using angle-resolved X-ray photoelectron spectroscopy
| Autor: | Zemek, J., Houdkova, J., Jiricek, P., Izak, T., Kalbac, M. |
|---|---|
| Zdroj: | In Applied Surface Science 15 October 2019 491:16-23 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect