Interface analysis of TiN/n-GaN Ohmic contacts with high thermal stability

Autor: Zhu, Yafeng, Huang, Rong, Li, Zhengcheng, Hao, Hui, An, Yuxin, Liu, Tong, Zhao, Yanfei, Shen, Yang, Guo, Yun, Li, Fangsen, Ding, Sunan
Zdroj: In Applied Surface Science 1 July 2019 481:1148-1153
Databáze: ScienceDirect