Surface and interface properties of ZrO2/GaAs, SiO2/GaAs and GaP/GaAs hetero structures investigated by surface photovoltage spectroscopy

Autor: Roychowdhury, R., Dixit, V.K., Vashisht, Geetanjali, Sharma, T.K., Mukherjee, C., Rai, S.K., Kumar, Shailendra
Zdroj: In Applied Surface Science 15 May 2019 476:615-622
Databáze: ScienceDirect