In-doped As2Se3 thin films studied by Raman and X-ray photoelectron spectroscopies

Autor: Azhniuk, Yuriy, Dzhagan, Volodymyr, Solonenko, Dmytro, Loya, Vasyl, Grytsyshche, Iaroslav, Lopushansky, Vasyl, Gomonnai, Alexander, Zahn, Dietrich R.T.
Zdroj: In Applied Surface Science 31 March 2019 471:943-949
Databáze: ScienceDirect