Effects of high-dosage focused electron-beam irradiation at energies ≤ 30 keV on graphene on SiO2
| Autor: | Femi-Oyetoro, J.D., Yao, K., Roccapriore, K., Ecton, P.A., Tang, R., Jones, J.D., Verbeck, G., Perez, J.M. |
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| Zdroj: | In Applied Surface Science 1 March 2019 469:325-330 |
| Databáze: | ScienceDirect |
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